Description: Design and Analysis of Accelerated Tests for Mission Critical Reliability, Hardcover by LuValle, Michael J.; Lefevree, Bruce G.; Kannan, Sri Raman; Lefevre, Bruce G.; Kannan, Sriraman, ISBN 1584884711, ISBN-13 9781584884712, Brand New, Free shipping in the US This study presents innovative theory and methods for recognizing and handling complicated cases. The theory integrates a physical understanding of underlying phenomena and the statistical modeling of observation "noise" to provide a single framework for accelerated testing. The treatment include general approaches compatible with various software packages. The authors are reliability specialists working in private industry. Annotation ©2004 Book News, Inc., Portland, OR ()
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Book Title: Design and Analysis of Accelerated Tests for Mission Critical Rel
Number of Pages: 248 Pages
Language: English
Publication Name: Design and Analysis of Accelerated Tests for Mission Critical Reliability
Publisher: CRC Press LLC
Subject: Quality Control
Publication Year: 2004
Item Height: 0.7 in
Type: Textbook
Item Weight: 17 Oz
Author: Sirraman Kannan, Bruce G. Lefevre, Michael J. Luvalle
Subject Area: Technology & Engineering, Business & Economics
Item Length: 9.4 in
Item Width: 6.4 in
Format: Hardcover
