Description: Fundamentals of Ultrasonic Nondestructive Evaluation Please note: this item is printed on demand and will take extra time before it can be dispatched to you (up to 20 working days). A Modeling Approach Author(s): Lester W. Schmerr Jr. Format: Paperback Publisher: Springer International Publishing AG, Switzerland Imprint: Springer International Publishing AG ISBN-13: 9783319808161, 978-3319808161 Synopsis This extensively revised and updated second edition of a widely read classic presents the use of ultrasound in nondestructive evaluation (NDE) inspections. Retaining the first edition's use of wave propagation /scattering theory and linear system theory, this volume also adds significant new material including: the introduction of MATLAB (R) functions and scripts that evaluate key results involving beam propagation and scattering, flaw sizing, and the modeling of ultrasonic systems. elements of Gaussian beam theory and a multi-Gaussian ultrasonic beam model for bulk wave transducers. a new chapter on the connection between ultrasonic modeling and probability of detection (POD) and reliability models. new and improved derivations of ultrasonic measurement models. updated coverage of ultrasonic simulators that have been developed around the world. Students, engineers, and researchers working in the ultrasonic NDE field will find a wealth of information on the modeling of ultrasonic inspections and the fundamental ultrasonic experiments that support those models in this new edition.
Price: 197.88 GBP
Location: Aldershot
End Time: 2025-01-26T17:12:23.000Z
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Book Title: Fundamentals of Ultrasonic Nondestructive Evaluation
Number of Pages: 758 Pages
Publication Name: Fundamentals of Ultrasonic Nondestructive Evaluation: a Modeling Approach
Language: English
Publisher: Springer International Publishing A&G
Item Height: 235 mm
Subject: Mechanics, Radiology, Mathematics
Publication Year: 2018
Type: Textbook
Item Weight: 1169 g
Subject Area: Mechanical Engineering
Author: Lester W. Schmerr Jr.
Item Width: 155 mm
Series: Springer Series in Measurement Science and Technology
Format: Paperback
