Description: Point and Extended Defects in Semiconductors by Giorgio Benedek Estimated delivery 3-12 business days Format Paperback Condition Brand New Description The systematic study of defects in semiconductors began in the early fifties. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together. Publisher Description The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. The book does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together. Details ISBN 146845711X ISBN-13 9781468457117 Title Point and Extended Defects in Semiconductors Author Giorgio Benedek Format Paperback Year 2013 Pages 287 Publisher Springer-Verlag New York Inc. GE_Item_ID:158854016; About Us Grand Eagle Retail is the ideal place for all your shopping needs! With fast shipping, low prices, friendly service and over 1,000,000 in stock items - you're bound to find what you want, at a price you'll love! Shipping & Delivery Times Shipping is FREE to any address in USA. Please view eBay estimated delivery times at the top of the listing. Deliveries are made by either USPS or Courier. We are unable to deliver faster than stated. International deliveries will take 1-6 weeks. NOTE: We are unable to offer combined shipping for multiple items purchased. This is because our items are shipped from different locations. Returns If you wish to return an item, please consult our Returns Policy as below: Please contact Customer Services and request "Return Authorisation" before you send your item back to us. Unauthorised returns will not be accepted. Returns must be postmarked within 4 business days of authorisation and must be in resellable condition. Returns are shipped at the customer's risk. We cannot take responsibility for items which are lost or damaged in transit. For purchases where a shipping charge was paid, there will be no refund of the original shipping charge. Additional Questions If you have any questions please feel free to Contact Us. Categories Baby Books Electronics Fashion Games Health & Beauty Home, Garden & Pets Movies Music Sports & Outdoors Toys
Price: 67.04 USD
Location: Fairfield, Ohio
End Time: 2024-12-27T03:42:13.000Z
Shipping Cost: 0 USD
Product Images
Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
ISBN-13: 9781468457117
Book Title: Point and Extended Defects in Semiconductors
Number of Pages: X, 287 Pages
Language: English
Publication Name: Point and Extended Defects in Semiconductors
Publisher: Springer
Item Height: 0.2 in
Subject: Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Electronics / Semiconductors, Chemistry / Physical & Theoretical
Publication Year: 2013
Type: Textbook
Item Weight: 20.2 Oz
Subject Area: Technology & Engineering, Science
Author: Giorgio Benedek
Item Length: 10 in
Series: NATO Science Series B: Ser.
Item Width: 7 in
Format: Trade Paperback