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Point and Extended Defects in Semiconductors, Paperback by Benedek, Giorgio (...

Description: Point and Extended Defects in Semiconductors, Paperback by Benedek, Giorgio (EDT), ISBN 146845711X, ISBN-13 9781468457117, Like New Used, Free shipping in the US The systematic study of defects in semiconductors began in the early fifties. FrQm that time on many questions about the defect structure and properties have been an swered, but many others are still a matter of investigation and discussion. Moreover, during these years new problems arose in connection with the identification and char acterization of defects, their role in determining transport and optical properties of semiconductor materials and devices, as well as from the technology of the ever in creasing scale of integration. This book presents to the reader a view into both basic concepts of defect physics and recent developments of high resolution experimental techniques. Th does not aim at an exhaustive presentation of modern defect physics; rather it gathers a number of topics which represent the present-time research in this field. The volume collects the contributions to the Advanced Research Workshop "Point, Extended and Surface Defects in Semiconductors" held at the Ettore Majo rana Centre at Erice (Italy) from 2 to 7 November 1988, in the framework of the International School of Materials Science and Technology. The workshop has brought together scientists from thirteen countries. Most participants are currently working on defect problems in either silicon submicron technology or in quantum wells and superlattices, where point defects, dislocations, interfaces and surfaces are closely packed together.

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Point and Extended Defects in Semiconductors, Paperback by Benedek, Giorgio (...

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Restocking Fee: No

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 14 Days

Refund will be given as: Money Back

Book Title: Point and Extended Defects in Semiconductors

Number of Pages: X, 287 Pages

Publication Name: Point and Extended Defects in Semiconductors

Language: English

Publisher: Springer

Publication Year: 2013

Subject: Physics / Condensed Matter, Spectroscopy & Spectrum Analysis, Electronics / Semiconductors, Chemistry / Physical & Theoretical

Item Height: 0.2 in

Item Weight: 20.2 Oz

Type: Textbook

Item Length: 10 in

Author: Giorgio Benedek

Subject Area: Technology & Engineering, Science

Item Width: 7 in

Series: NATO Science Series B: Ser.

Format: Trade Paperback

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